Indirect detection of clock skew induced hold-time violations on functional paths using scan shift operations

Hold-time violations in a scan circuit may occur both in the scan chain and in its combinational logic part. If a hold-time violation occurs on the scan path from one scan cell to another, it is also likely to happen on short functional paths between the two cells, which have clock skew. This paper is intended to indirectly detect hold-time violations on… (More)