Increasing the on-die nodal observability and controllability use of advanced design for debug circuit features

@article{Chen2008IncreasingTO,
  title={Increasing the on-die nodal observability and controllability use of advanced design for debug circuit features},
  author={Y.-C.S. Chen and Dan Bockelman},
  journal={2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)},
  year={2008},
  pages={13-16}
}
A post-silicon design validation methodology using on-die clock design for debug (DFD) circuits working together with advanced optical silicon probing techniques has been developed. Innovations are on increasing the nodal observability by using an infrared photon-emission (IREM) logic state image (LSI) technique and on increasing the nodal controllability by using a laser assisted device alternation (LADA) technique. This new approach provides a better solution for determining the root causes… CONTINUE READING

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