Increasing fault coverage during functional test in the operational phase

Abstract

A key issue in many safety-critical applications is the test of the ICs to be performed during the operational phase: regulations and standards often explicitly describe fault coverage figures to be achieved. Functional test (i.e., a test exploiting only functional inputs and outputs, without resorting to any Design for Testability) is often the only viable… (More)
DOI: 10.1109/IOLTS.2013.6604049

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Cite this paper

@article{Carvalho2013IncreasingFC, title={Increasing fault coverage during functional test in the operational phase}, author={Mauricio de Carvalho and Paolo Bernardi and Ernesto S{\'a}nchez and Matteo Sonza Reorda and Oscar Ballan}, journal={2013 IEEE 19th International On-Line Testing Symposium (IOLTS)}, year={2013}, pages={43-48} }