InGaP / GaAs HBT Safe Operating Area and Thermal Size Effect

@inproceedings{Tao2012InGaPG,
  title={InGaP / GaAs HBT Safe Operating Area and Thermal Size Effect},
  author={Nick GM Tao and Chien-Ping Lee and Tim Henderson},
  year={2012}
}
Deeply understanding HBT thermal characteristics and safe operating area (SOA) is critical to the improvement of the ruggedness and reliability of power amplifiers. In this work, we investigate the device size effect of SOA and thermal resistance by means of experimental measurement, analytical modeling and 3dimensional simulation. For HBTs with a factor of ten variations in emitter area, the SOAs are characterized under extremely high current density, and the thermal simulations are performed… CONTINUE READING

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2D numerical simulation for InGaP/GaAs HBT safe operating area

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