In-situ tensile testing of nano-scale specimens in SEM and TEM

M. A. Haque; M. Saif

DOI:10.1007/BF02411059

Corpus ID: 136678366

In-situ tensile testing of nano-scale specimens in SEM and TEM

@article{Haque2002InsituTT,
  title={In-situ tensile testing of nano-scale specimens in SEM and TEM},
  author={M. A. Haque and M. Saif},
  journal={Experimental Mechanics},
  year={2002},
  volume={42},
  pages={123-128}
}

M. A. Haque, M. Saif

Published 2002

Materials Science

Experimental Mechanics

We present a new experimental method for the mechanical characterization of freestanding thin films with thickness on the order of nanometers to micrometers. The method allows, for the first time, in-situ SEM and TEM observation of materials response under uniaxial tension, with measurements of both stresses and strains under a wide variety of environmental conditions such as temperature and humidity. The materials that can be tested include metals, dielectrics, and multi-layer composites that… CONTINUE READING

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