In situ XPS analysis of various iron oxide films grown by NO2-assisted molecular-beam epitaxy

@article{Fujii1999InSX,
  title={In situ XPS analysis of various iron oxide films grown by NO2-assisted molecular-beam epitaxy},
  author={Tatsuo Fujii and Frank de Groot and George A. Sawatzky and F. C. Voogt and Tjipke Hibma and Kozo Okada},
  journal={Physical Review B},
  year={1999},
  volume={59},
  pages={3195-3202}
}
We report on a systematic analysis of x-ray photoelectron spectroscopy (XPS) core- and valence-level spectra of clean and well-characterized iron oxide films, i.e., $\ensuremath{\alpha}\ensuremath{-}{\mathrm{Fe}}_{2}{\mathrm{O}}_{3},$ $\ensuremath{\gamma}\ensuremath{-}{\mathrm{Fe}}_{2}{\mathrm{O}}_{3},$ ${\mathrm{Fe}}_{3\mathrm{\ensuremath{-}}\mathrm{\ensuremath{\delta}}}{\mathrm{O}}_{4},$ and ${\mathrm{Fe}}_{3}{\mathrm{O}}_{4}.$ All iron oxide films were prepared epitaxially by ${\mathrm{NO}}_… 

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