In search of the optimum test set - adaptive test methods for maximum defect coverage and lowest test cost

@article{Madge2004InSO,
  title={In search of the optimum test set - adaptive test methods for maximum defect coverage and lowest test cost},
  author={Robert Madge and Brady Benware and Ritesh P. Turakhia and W. Robert Daasch and Chris Schuermyer and Jens Ruffler},
  journal={2004 International Conferce on Test},
  year={2004},
  pages={203-212}
}
Maintaining product quality at reasonable test cost in very deep sub-micron process has become a major challenge especially due to multiple manufacturing locations with varying defect and parametric distributions. Increasing vector counts and binary search routines are now necessary for subtle defect screening. In addition, parametric tests and at-spec testing is still often necessary to ensure customer quality. Systematic defects are becoming more common and threaten to dominate the yield… CONTINUE READING
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  • B. Benware, C. Lu, +4 authors M. Kassab
  • Rajski “Affordable and Effective Screening of…
  • 2004
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