In-field aging measurement and calibration for power-performance optimization

Abstract

Aging of transistors has become a major reliability concern especially when the VLSI circuits are in the nanometer regime. In this paper, we propose a novel methodology to address circuit aging in the field. On-chip aging sensor is designed to monitor transitions on functional paths capturing functional mode workload. Path delay is then accurately measured… (More)
DOI: 10.1145/2024724.2024883

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