In-Situ Measurement of Power Loss for Crystalline Silicon Modules Undergoing Thermal Cycling and Mechanical Loading Stress Testing Preprint

@inproceedings{Spataru2015InSituMO,
  title={In-Situ Measurement of Power Loss for Crystalline Silicon Modules Undergoing Thermal Cycling and Mechanical Loading Stress Testing Preprint},
  author={Sergiu Viorel Spataru and Peter Hacke and Dezso Sera},
  year={2015}
}
We analyze the degradation of multi-crystalline silicon photovoltaic modules undergoing simultaneous thermal, mechanical, and humidity-freeze stress testing to develop a dark environmental chamber in-situ measurement procedure for determining module power loss. We analyze dark I-V curves measured on modules undergoing degradation in three steps; first for shunting and recombination losses; second, series resistance and lifetime losses; and finally, other losses including short circuit current… CONTINUE READING