Improving topological ATPG with symbolic techniques

Abstract

This paper presents a new approach to Automatic Test Pattern Generation for sequential circuits. Traditional topological algorithms nowadays are able to deal with very large circuits, but often fail when highly sequential subnetworks are found. On the other hand, symbolic techniques based on Binary Decision Diagrams proved themselves very efficient on small… (More)
DOI: 10.1109/VTEST.1995.512658

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