Improving Test Pattern Compactness in SAT-based ATPG

  title={Improving Test Pattern Compactness in SAT-based ATPG},
  author={S. Eggersgluss and R. Drechsler},
  journal={16th Asian Test Symposium (ATS 2007)},
  • S. Eggersgluss, R. Drechsler
  • Published 2007
  • Computer Science
  • 16th Asian Test Symposium (ATS 2007)
  • Automatic test pattern generation (ATPG) is one of the core problems in testing of digital circuits. [...] Key Result SAT-based ATPG clearly outperforms classical approaches especially for hard-to-detect faults. But due to the SAT provers, a major drawback of the resulting test patterns is that a large number of input bits is specified. Thus, the resulting patterns are not well suited for test compaction and compression. In this paper we present techniques to increase the number of unspecified bits in test…Expand Abstract
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