Improvement of the Reliability of Dielectrics for MLCC

@inproceedings{Nakamura2011ImprovementOT,
  title={Improvement of the Reliability of Dielectrics for MLCC},
  author={Tomoyuki Nakamura and Takayuki Yao and Jun Ikeda and Noriyuki Kubodera and Hiroshi Takagi},
  year={2011}
}
To achieve enough reliability of monolithic ceramic capacitor, it is important to know the contribution of grain boundary and grain interior to its reliability and insulation resistance. As the number of grain boundaries per layer increased, mean time to failure (MTTF) increased. In addition, as the number of grain boundaries per layer increased, samples showed lower current leakage in the measured electric field range. Using these data, the grain boundary E-J curves were determined by… CONTINUE READING

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