Improvement of catastrophic optical damage (COD) level for high-power 0.98-μm GaInAs-GaInP laser

Abstract

We investigate improvement of catastrophic optical damage (COD) level for Al-free 0.98-/spl mu/m ridge waveguide laser diodes (LDs) using the impurity induced layer disordering (IILD) process applied near the facets. The IILD is used for the purpose of forming transparent windows near both facets of the LDs utilizing its ability to increase bandgap energy… (More)

Topics

4 Figures and Tables

Slides referencing similar topics