Improved step stress accelerated life testing method for electronic product

@article{He2012ImprovedSS,
  title={Improved step stress accelerated life testing method for electronic product},
  author={Qingchuan He and Wenhua Chen and Jun Pan and Ping Qian},
  journal={Microelectronics Reliability},
  year={2012},
  volume={52},
  pages={2773-2780}
}

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