Improved hydrogen and deuterium depth profiling in polymers using low energy forward recoil spectrometry

@inproceedings{Genzer1994ImprovedHA,
  title={Improved hydrogen and deuterium depth profiling in polymers using low energy forward recoil spectrometry},
  author={Jan Genzer and Jeffrey B. Rothman and Russell J Composto},
  year={1994}
}
Abstract We demonstrate that the hydrogen and deuterium depth resolution of forward recoil spectrometry (FRES) is greatly improved by utilizing 1.3 MeV 4 He ions and sample tilting. The near-surface depth resolution is measured on samples of alternating deuterated and protonated polystyrene layers, each ca 250 A thick. The depth resolution at the surface is dramatically improved (from 800 A to 250 A) as the incident beam energy decreases from 3.0 to 1.3 MeV. We call this technique low-energy… CONTINUE READING

Figures and Tables from this paper.

Citations

Publications citing this paper.
SHOWING 1-2 OF 2 CITATIONS

References

Publications referenced by this paper.
SHOWING 1-2 OF 2 REFERENCES

Vidensk. Selsk. Mat.-Fys

N. Bohr, K. Dan
  • Medd. 18,
  • 1948