Improved and accurate physics-of-failure (PoF) methodology for qualification and lifetime assessment of electronic systems

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@article{BeyTemsamani2017ImprovedAA, title={Improved and accurate physics-of-failure (PoF) methodology for qualification and lifetime assessment of electronic systems}, author={Abdellatif Bey-Temsamani and S. Kauffmann and Y. Descas and Bart Vandevelde and Franco Zanon and Geert Willems}, journal={Microelectronics Reliability}, year={2017}, volume={76-77}, pages={42-46} }