Improved SAT-based ATPG: More constraints, better compaction

  title={Improved SAT-based ATPG: More constraints, better compaction},
  author={Stephan Eggersgl{\"u}\ss and Robert Wille and Rolf Drechsler},
  journal={2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)},
Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT) is a robust alternative to classical structural ATPG. Due to the powerful reasoning engines of modern SAT solvers, SAT-based algorithms typically provide a high test coverage because of the ability to reliably classify hard-to-detect faults. However, a drawback of SAT-based ATPG is the test compaction ability. In this paper, we propose an enhanced dynamic test compaction approach which leverages the high implicative… CONTINUE READING
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