Implications of Characterization Temperature on Hardness Assurance Qualification


To explore the impact of temperature on the post-irradiation response of ICs, we characterized the temperature response of transistors, SRAMs, and a custom mixed-signal ASIC. Devices were irradiated at room temperature and electrically characterized post irradiation as a function of temperature. Devices exhibit significantly more parametric degradation when… (More)

9 Figures and Tables


  • Presentations referencing similar topics