Implications of BTI-Induced Time-Dependent Statistics on Yield Estimation of Digital Circuits

@article{Weckx2014ImplicationsOB,
  title={Implications of BTI-Induced Time-Dependent Statistics on Yield Estimation of Digital Circuits},
  author={Pieter Weckx and Ben Kaczer and Maria Toledano-Luque and Praveen Raghavan and Jacopo Franco and Philippe Roussel and Guido Groeseneken and Francky Catthoor},
  journal={IEEE Transactions on Electron Devices},
  year={2014},
  volume={61},
  pages={666-673}
}
This paper describes the implications of bias temperature instability (BTI)-induced time-dependent threshold voltage distributions on the performance and yield estimation of digital circuits. The statistical distributions encompassing both time-zero and time-dependent variability and their correlations are discussed. The impact of using normally distributed threshold voltages, imposed by state-of-the-art design approaches, is contrasted with our defect-centric approach. Extensive Monte Carlo… CONTINUE READING
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