Impacts of NBTI/PBTI on SRAM V<inf>MIN</inf> and design techniques for SRAM V<inf>MIN</inf> improvement

Abstract

Negative Bias Temperature Instability (NBTI) and Positive Bias Temperature Instability (PBTI) are critical circuit reliability issues in highly scaled CMOS technologies. In this paper, we analyze the impacts of NBTI and PBTI on SRAM Vmini and present a design solution for mitigating the impact of NBTI and PBTI on SRAM V<inf>MIN</inf>. Two different SRAM V… (More)
DOI: 10.1109/ISOCC.2011.6138672

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