Impact of process scaling on the efficacy of leakage reduction schemes

Abstract

The effects of technology scaling on three run-time leakage reduction techniques (Input Vector Control, Body Bias Control and Power Supply Gating) are evaluated by determining their limits and benefits, in terms of the potential leakage reduction, performance penalty and area and power overhead in 0.25/spl mu/m, 0.18/spl mu/m, 0.07/spl mu/m and 0.065/spl mu… (More)

Topics

15 Figures and Tables

Cite this paper

@article{Tsai2004ImpactOP, title={Impact of process scaling on the efficacy of leakage reduction schemes}, author={Yuh-Fang Tsai and D. E. Duarte and Narayanan Vijaykrishnan and M. J. Irwin}, journal={2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)}, year={2004}, pages={3-11} }