• Corpus ID: 256459529

Impact of Surface Roughness in Measuring Optoelectronic Characteristics of Thin-Film Solar Cells

  title={Impact of Surface Roughness in Measuring Optoelectronic Characteristics of Thin-Film Solar Cells},
  author={David J. Magginetti and Seokmin Jeon and Yohan Yoon and Ashif Choudhury and A. H. Mamun and Yang Qian and Jordan M. Gerton and Heayoung P. Yoon},
— Microstructural properties of thin-film absorber layers play a vital role in developing high-performance solar cells. Scanning probe microscopy is frequently used for measuring spatially inhomogeneous properties of thin-film solar cells. While powerful, the nanoscale probe can be sensitive to the roughness of samples, introducing convoluted signals and unintended artifacts into the measurement. Here, we apply a glancing-angle focused ion beam (FIB) technique to reduce the surface roughness of… 

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