Impact of SEU configurations on a SRAM cell response at circuit level

  title={Impact of SEU configurations on a SRAM cell response at circuit level},
  author={Gilles Micolau and Hassen Aziza and K. Castellani-Coulie and J-M. Portal},
  journal={2011 12th Latin American Test Workshop (LATW)},
This work focuses on the SEU simulation in a 90nm SRAM cell, in order to provide basic metrics for reliability studies. To do that, a charge generation model is used to simulate the impact of an ionizing particle striking a sensitive node. The current collected at this particular node is extracted and injected at a circuit level. Thus, a correlation between the circuit electrical behavior and the critical charge is presented. 


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