Imaging minority carrier diffusion in GaN nanowires using near field optical microscopy

@inproceedings{Baird2009ImagingMC,
  title={Imaging minority carrier diffusion in GaN nanowires using near field optical microscopy},
  author={Lee Baird and Grace Ang and Chee Hoong Low and Nancy M. Haegel and Albert Alec Talin and Qiming Li and George T. Wang},
  year={2009}
}
Abstract A novel system has been developed for the imaging of carrier transport within semiconductor nanostructures by operating a near field scanning optical microscopy (NSOM) within a scanning electron microscope. Luminescence associated with carrier recombination is collected with high spatial resolution to monitor the motion and recombination of charge generated by use of an electron beam as an independent point source. Light is collected in the near field from a scanning fiber using tuning… CONTINUE READING