Imaging mechanism of piezoresponse force microscopy of ferroelectric surfaces

@inproceedings{Kalinin2002ImagingMO,
  title={Imaging mechanism of piezoresponse force microscopy of ferroelectric surfaces},
  author={Sergei V. Kalinin and Dawn A. Bonnell},
  year={2002}
}
In order to determine the origin of image contrast in piezoresponse force microscopy (PFM), analytical descriptions of the complex interactions between a small tip and ferroelectric surface are derived for several sets of limiting conditions. Image charge calculations are used to determine potential and field distributions at the tip-surface junction between a spherical tip and an anisotropic dielectric half plane. Methods of Hertzian mechanics are used to calculate the response amplitude in… CONTINUE READING

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