Imaging a two-dimensional electron system with a scanning charged probe


We introduce a new and conceptually simple scanning probe method to resolve potential fluctuations within a GaAs two-dimensional electron system ~2DES!. The method employs a charged metal tip to deplete locally the 2DES. The depletion is detected as a reduction in capacitance, measured using a cryogenic transistor attached directly to the tip. The resulting… (More)


3 Figures and Tables