• Corpus ID: 245668858

Imaging Ferroelectrics: Charge Gradient Microscopy (CGM) versus Potential Gradient Microscopy (PGM)

  title={Imaging Ferroelectrics: Charge Gradient Microscopy (CGM) versus Potential Gradient Microscopy (PGM)},
  author={Jesi R. Maguire and Hamza Waseem and R. G. P. McQuaid and Amit Kumar and J. Marty Gregg and Charlotte Cochard},
In 2014, Charge Gradient Microscopy (CGM) was first reported as a new scanning probe imaging mode, particularly well-suited for the characterisation of ferroelectrics. The implementation of the technique is straightforward; it involves monitoring currents that spontaneously develop between a passive conducting atomic force microscopy tip and Earth, as the tip is scanned across the specimen surface. However, details on the fundamental origin of contrast and what images mean, in terms of… 

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