Images matching based on edge maps and wavelet transform

Abstract

A structure-based image similarity measurement called DTWT-SSIM is presented. The main idea behind DTWT-SSIM is to combine the shift-invariance advantage of dual-tree wavelet transform (DTWT) with the structure-preserving property of the structural similarity metrics (SSIM). A series of experimental results show the improved measurement to be an effective and stable metric in the comparison of edge maps when small noise and distortion appear in the images.

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Cite this paper

@article{Lee2010ImagesMB, title={Images matching based on edge maps and wavelet transform}, author={Mong-Shu Lee and Mu-Yen Chen and Dah-Jing Jwo}, journal={2010 3rd International Congress on Image and Signal Processing}, year={2010}, volume={3}, pages={1054-1058} }