Image quality inspection for electronic displays based on visual human factors

  title={Image quality inspection for electronic displays based on visual human factors},
  author={Toshio Asano and Kazuyuki Ishiguro and Takahiro Kondoh and Wei Liu},
  journal={IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society},
A novel image quality inspection method that uses the analysis of Fourier power spectrum is presented. The method can inspect mura(non-uniform) defects regardless of mura types. The original inspection image is transformed into frequency domain using Fourier transform. The Fourier power spectrum is filtered by CSF (Contrast Sensitivity Function) to match with the human visual perception. After the filtering, two kinds of histograms, frequency and direction, are calculated. The defect samples… CONTINUE READING


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