Identifying design systematics using learning based diagnostic analysis

  title={Identifying design systematics using learning based diagnostic analysis},
  author={Rao Desineni and Leah Pastel and Maroun Kassab and Mohammed Fazil Fayaz and Julie Lee},
  journal={2010 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC)},
With billions of transistors being integrated on a single chip by modern VLSI manufacturing processes, traditional yield learning techniques based on defect density present serious drawbacks. Manufacturing process simulation and yield prediction techniques based solely on random defects are increasingly deviating from the actual yields. Design rules are constantly being modified as new design marginalities are uncovered during yield learning, often without much statistical/yield validation. In… CONTINUE READING
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