Identifying Biases of a Defect Diagnosis Procedure

  • Irith Pomeranz
  • Published 2017 in
    IEEE Transactions on Computer-Aided Design of…


A defect diagnosis procedure is an important part of the yield improvement process. As defects become more complex, the output responses they produce differ to larger extents from the output responses of modeled faults, and they become more difficult to diagnose. Biases in the defect diagnosis procedure can also cause defects to be more difficult to… (More)
DOI: 10.1109/TCAD.2016.2618859


12 Figures and Tables