IEEE P1687 IJTAG a presentation of current technology

Abstract

The use of embedded test instrumentation in ASIC designs has changed dramatically over the last decade. This is due to a variety of forces that affect the semiconductor industry. Unfortunately, processes surrounding test creation and validation this instrumentation has become significantly more complicated in recent years. IEEE P1687, which is now nearing… (More)
DOI: 10.1109/TEST.2009.5355639

Topics

  • Presentations referencing similar topics