IDDQ Testing Method using a Scan Pattern for Production Testing

@article{Hirase2005IDDQTM,
  title={IDDQ Testing Method using a Scan Pattern for Production Testing},
  author={Junichi Hirase and Yoshiyuki Goi and Yoshiyuki Tanaka},
  journal={14th Asian Test Symposium (ATS'05)},
  year={2005},
  pages={18-21}
}
With the miniaturization of the diffusion process, the leak current per transistor tends to increase and the number of transistors per die tends to become larger, thus rendering more difficult the discrimination through the absolute value of IDDQ (Quiescent power supply current) that is required to detect defects on VLSI (Very Large Scale Integration). On the other hand, scan patterns convenient for their logical quality improvement are widely used. When adopting such a scan pattern and… CONTINUE READING

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