I DDT: Fundamentals and test generation

Abstract

It is the time to explore the fundamentals ofI DDT testing when extensive work has been done forI DDT testing since it was proposed. This paper precisely defines the concept of average transient current (I DDT) of CMOS digital ICs, and experimentally analyzes the feasibility ofI DDT test generation at gate level. Based on the SPICE simulation results, the… (More)
DOI: 10.1007/BF02948899

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