Hybrid Built-In Self-Test and Test Generation Techniques for Digital Systems

@inproceedings{Jervan2005HybridBS,
  title={Hybrid Built-In Self-Test and Test Generation Techniques for Digital Systems},
  author={Gert Jervan},
  year={2005}
}
The technological development is enabling the production of increasingly complex electronic systems. All such systems must be verified and tested to guarantee their correct behavior. As the complexity grows, testing has become one of the most significant factors that contribute to the total development cost. In recent years, we have also witnessed the inadequacy of the established testing methods, most of which are based on low-level representations of the hardware circuits. Therefore, more… CONTINUE READING
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