Hybrid AFM for Nanoscale Physicochemical Characterization: Recent Development and Emerging Applications.

Abstract

Atomic force microscopy (AFM) has evolved to be one of the most powerful tools for the characterization of material surfaces especially at the nanoscale. Recent development of AFM has incorporated a suite of analytical techniques including surface-enhanced Raman scattering (SERS) technique and infrared (IR) spectroscopy to further reveal chemical… (More)
DOI: 10.1002/smll.201603525

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