• Corpus ID: 119244887

Humidity effects on evolution of CsI thin Films: Fractal studies of rough surfaces

  title={Humidity effects on evolution of CsI thin Films: Fractal studies of rough surfaces},
  author={Nabeel Jammal and R. P. Yadav and Triloki and R. C. Rai and Ashok Kumar Mittal and B K Singh},
  journal={arXiv: Instrumentation and Detectors},
The present work investigates the morphological, micro-structural, compositional and fractal analysis for CsI thin films in case of "as-deposited" and "1 hour humid air aged". The variation of grain sizes obtained from transmission electron microscopy (TEM) technique are found to be in the range of ~ 313 nm to ~ 1058 nm. The average grain size is found to increase after exposing to humidity. The experimental values of interplanner spacing are found to be less than the standard value which… 

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