How to select fast scanning frequencies for high-resolution fast STM measurements with a conventional microscope

@inproceedings{Dri2012HowTS,
  title={How to select fast scanning frequencies for high-resolution fast STM measurements with a conventional microscope},
  author={Carlo Dri and Friedrich Esch and Cristina Africh and Giovanni Comelli},
  year={2012}
}
The implementation of fast measurement modes in conventional scanning tunneling microscopes (STM) generally implies that at least the fast scanning frequency reaches or exceeds the first resonance frequency of the scanning stage. We present a straightforward protocol for the determination of accessible frequency windows, where high spatial resolution can be routinely achieved and maintained during the fast scanning movement. This protocol relies on a simple, in situ method to locate these… CONTINUE READING