Hot carrier impact on the small signal equivalent circuit

  title={Hot carrier impact on the small signal equivalent circuit},
  author={Laurent Negre and David Roy and Samuel Boret and Patrick Scheer and N. Kauffmann and Daniel Gloria and G{\'e}rard Ghibaudo},
  journal={2010 IEEE International Integrated Reliability Workshop Final Report},
RF reliability is becoming an increasing concern for actual technology platforms. In this context, small signal equivalent circuit degradation under hot carrier stress is investigated. It is shown that some lumped elements such as the conductance, the transconductance, the gate-to-drain capacitance, and series resistances are degraded. The application of… CONTINUE READING