Highly Accelerated Life Test for the Reliability Assessment of the Lead-Free SMT Mainboard

@article{Li2006HighlyAL,
  title={Highly Accelerated Life Test for the Reliability Assessment of the Lead-Free SMT Mainboard},
  author={Wei Li and Rong-Chang Feng},
  journal={2006 International Microsystems, Package, Assembly Conference Taiwan},
  year={2006},
  pages={1-4}
}
The highly accelerated life test (HALT) has been widely used in the industry to evaluate the reliability and qualification of electronic products. However, no lifetime prediction of product will result from this method and it is merely an index of product quality. In this paper, several procedures have been proposed to improve the HALT in order to provide… CONTINUE READING