High viscosity environments: an unexpected route to obtain true atomic resolution with atomic force microscopy.


Atomic force microscopy (AFM) is widely used in liquid environments, where true atomic resolution at the solid-liquid interface can now be routinely achieved. It is generally expected that AFM operation in more viscous environments results in an increased noise contribution from the thermal motion of the cantilever, thereby reducing the signal-to-noise… (More)
DOI: 10.1088/0957-4484/25/17/175701


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