High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy

@inproceedings{Oral2003HighsensitivityNA,
  title={High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy},
  author={Ahmet Yavuz Oral and Ralph A. Grimble and H {\"O}zg{\"u}r {\"O}zer and John B. Pethica},
  year={2003}
}
We describe a new, highly sensitive noncontact atomic force microscope/scanning tunneling microscope (STM) operating in ultrahigh vacuum (UHV) with subangstrom oscillation amplitudes for atomic resolution imaging and force–distance spectroscopy. A novel fiber interferometer with ∼4×10−4 A/Hz noise level is employed to detect cantilever displacements. Subangstrom oscillation amplitude is applied to the lever at a frequency well below the resonance and changes in the oscillation amplitude due to… CONTINUE READING