High sensitivity analysis of SiO 2 nanoparticles using the Agilent 8900 ICP - QQQ in MS / MS mode Application note

Abstract

ICP-MS is a well-established technique for measuring the elemental content of materials; the relatively recent development of Single Particle acquisition mode (spICP-MS) now provides a powerful method to characterize the NP content of a sample. spICP-MS is used to record the target element signals generated from individual NPs in the solution analyzed, allowing simultaneous determination of the number, concentration, and size of particles present, as well as the dissolved element concentration. This approach has been developed by many researchers [1-4], and modern ICP-MS instruments can now offer automated acquisition and calibration approaches to support NP characterization. Current ICP-MS systems use short dwell times and acquire data continuously for a single isotope with no High sensitivity analysis of SiO2 nanoparticles using the Agilent 8900 ICP-QQQ in MS/MS mode

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Cite this paper

@inproceedings{Yamanaka2016HighSA, title={High sensitivity analysis of SiO 2 nanoparticles using the Agilent 8900 ICP - QQQ in MS / MS mode Application note}, author={Michiko Yamanaka and Takayuki Itagaki}, year={2016} }