High resistance comparison among KRISS, VNIIM and NIM

Abstract

In a high resistance comparison among KRISS, VNIIM and NIM, the relative resistance values of measurement results agreed well within 2 ppm in 10 megohm and 5 ppm in 1 gigohm. Also, relative combined standard uncertainties of the three institutes is 4.9 ppm in 10 megohm and 11.6 ppm in 1 gigohm. 

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Cite this paper

@article{Yu2000HighRC, title={High resistance comparison among KRISS, VNIIM and NIM}, author={Kwang Min Yu and Young Tae Park and Je Cheon Ryu and Kwon Su Han and Yu. P. Semenov and B K Litvinov and Shao Haiming}, journal={Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031)}, year={2000}, pages={68-69} }