High performance feedback for fast scanning atomic force microscopes

@inproceedings{Schitter2001HighPF,
  title={High performance feedback for fast scanning atomic force microscopes},
  author={Georg Schitter},
  year={2001}
}
We identify the dynamics of an atomic force microscope ~AFM! in order to design a feedback controller that enables faster image acquisition at reduced imaging error compared to the now generally employed proportional integral differential ~PID! controllers. First, a force model for the tip–sample interaction in an AFM is used to show that the dynamic behavior of the cantilever working in contact mode can be neglected for control purposes due to the relatively small oscillation amplitude of the… CONTINUE READING
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