High-level test generation using physically-induced faults

  title={High-level test generation using physically-induced faults},
  author={Mark C. Hansen and John P. Hayes},
A high-level fault modeling and testing philosophy is proposed which is aimed at ensuring,full detection of lowlevel, physical faults, as well as the industry-standard single stuck-line (SSL) faults. A set of independent functional faults and the corresponding ,functional tests are derived (induced) from the circuit under test; ofparticulur interest are SSL-induced functional faults or SIFs. We present, ,for the.first time, complete functional circuit models and tests for representative 74X… CONTINUE READING


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