High-level test compaction techniques

@article{Ravi2002HighlevelTC,
  title={High-level test compaction techniques},
  author={Srivaths Ravi and Ganesh Lakshminarayana and Niraj K. Jha},
  journal={IEEE Trans. on CAD of Integrated Circuits and Systems},
  year={2002},
  volume={21},
  pages={827-841}
}