High-level simulation of embedded systems: experiences from the FIT project

Abstract

This paper summarizes the experiences gained from the EU project FIT which was aimed at the verification of TTP/C protocol. Several fault injection techniques have been successfully applied during the project, but we focus mainly on the "high level simulation" approach. The key contribution of the paper is a summary of the lessons learned from our… (More)
DOI: 10.1109/ISORC.2004.1300363

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