High-level path activation technique to speed up sequential circuit test generation

@article{Raik1999HighlevelPA,
  title={High-level path activation technique to speed up sequential circuit test generation},
  author={Jaan Raik and Raimund Ubar},
  journal={European Test Workshop 1999 (Cat. No.PR00390)},
  year={1999},
  pages={84-89}
}
In current paper, a novel high-level symbolic path activation technique for sequential circuit test generation is proposed. The technique has been implemented as a part of a hierarchical ATPG tool which utilizes internal representation of multi-level (register-transfer and structural levels) decision diagram models. Experiments show that the proposed method… CONTINUE READING