High level fault injection for attack simulation in smart cards

@article{Rothbart2004HighLF,
  title={High level fault injection for attack simulation in smart cards},
  author={Klaus Rothbart and Ulrich Neffe and Christian Steger and Reinhold Weiss and Edgar Rieger and Andreas M{\"u}hlberger},
  journal={13th Asian Test Symposium},
  year={2004},
  pages={118-121}
}
Smart cards are one of the smallest computing platforms in use today. They are used in an increasing number of security applications. To gain sensitive data, a lot of security attacks are performed on smart cards. Therefore it is mandatory to test smart cards for robustness in matters of security. Tests are very time consuming and are performed often very… CONTINUE READING